Xingsheng Wang
·Paper Publications
- [31] Xingsheng Wang,X. Wang, B. Cheng, A. R. Brown, C. Millar, J. B. Kuang, S. Nassif,A. Asenov.Xingsheng Wang.Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology.[J].IEEE Design & Test,2011,(6):18-28
- [32] Xingsheng Wang,X. Wang, A.R. Brown, N. Idris, S. Markov, G. Roy,A. Asenov.Xingsheng Wang.Statistical Threshold-Voltage Variability in Scaled Decananometer Bulk HKMG MOSFETs: A Full-Scale 3-D Simulation Scaling Study.[J].IEEE Transactions on Electron Devices,2011,(8):2293–2301