- [1]Donakowski, M. D.; Gautier, R.; Lu, H.; Tran, T. T.; Cantwell, J. R.; Halasyamani, P. S.; Poeppelmeier, K. R. *, Syntheses of Two Vanadium Oxide–Fluoride Materials That Differ in Phase Matchability. Inorganic Chemistry 2015, 54(3), 765-772;.
- [2]Shen, X.; Liu, Z.*; Lu, H.; Li, Y.; Investigation on Technics and Property of Broadband Infrared Antireflective Sub-Wavelength Structures Prepared by RIE on Ge Substrate, Mechanical Science and Technology for Aerospace Engineering 2009, 28(10), 1375-1378 (in Chinese)..
- [3]Feng, L.P.*; Liu, Z.; Tian, H.; Liu, Q.J.; Lu, H., Effect of Sputtering Power on Structure and Optical Properties of CuxAlyOz Films. IEEE 2010, 1-4;.
- [4]Su, J.; Feng, L. P.; Pan, H. X.; Lu, H.; Liu, Z. T.*, Modulating the Electronic Properties of Monolayer MoS2 through Heterostructure with Monolayer Gray Arsenic. Materials & Design, 2016, 96, 257-262;.
- [5]Tan, T.; Liu, Z.*; Lu, H.; Liu, W.; Tian, H., Structure and Optical Properties of HfO2 Thin Films on Silicon after Rapid Thermal Annealing. Optical Materials 2010, 32(3), 432-435;.
- [6]Jia, W.; Hu, J.; Ouyang, Z.;* Zhou, Y.; Lu, H.;* Wang, Z.*; Structure and 1/2-like magnetization plateu in a Seff=1/2 skew chain compound [Co2(CH3O-ip)(COOH)2(H2O)]n, Cryst. Growth Des. 2022, 22, 5, 3148–3153.
- [7]Tan, T.; Liu, Z.*; Lu, H.; Liu, W.; Yan, F., Chemical Structure and Electrical Properties of Sputtered HfO2 Films on Si Substrates Annealed by Rapid Thermal Annealing. Vacuum 2009, 83(9), 1155-1158;.
- [8]Tan, T.; Liu, Z.*; Lu, H.; Liu, W.; Yan, F.; Zhang, W., Band Structure and Valence-Band Offset of HfO2 Thin Film on Si Substrate from Photoemission Spectroscopy. Appl. Phys. A 2009, 97(2), 475-479;.
- [9]Shen, X.; Liu, Z.*; Li, Y.; Lu, H.; Preparation and Performance of Broadband Antireflective Sub-Wavelength Structures on Ge Substrate, Optoelectronics Letters 2009, 5(1), 11-13;.